Inline Spectrometer
✔ High-Precision Measurement: Employs a high-precision optical imaging metrology module, combined with an X/Y gantry stage and specialized illumination design, to provide high-precision CD/Overlay measurements.
✔ Multi-Functionality: Can be equipped with individual or integrated colorimetry/film thickness/OD spectrometer measurement modules to satisfy multiple measurement requirements in a single tool.
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Applied Field
Color Filter (CF)
PI film
Photoresist coating
Features
In the panel coating process, the quality of colorimetry, film thickness, and optical density (OD) are critical parameters for various display functions.
FAVITE’s Colorimetry/Film thickness/OD metrology machine achieves high-precision automated target measurements through individual and integrated spectrometer measurement modules.
Features:
✔ High-Precision Measurement: Employs a high-precision optical imaging metrology module, combined with an X/Y gantry stage and specialized illumination design, to provide high-precision CD/Overlay measurements.
✔ Multi-Functionality: Can be equipped with individual or integrated colorimetry/film thickness/OD spectrometer measurement modules to satisfy multiple measurement requirements in a single tool.
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