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  • Fine Resolution Array AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.4mm~1.1mm
    Optical Resolution >1um
    Target Defects Particles, line breakages, and other patterned defects
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Review System
  • Fine Resolution Array AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.4mm~1.1mm
    Optical Resolution > 2um
    Target Defects Particles, line breakages, and other patterned defects
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Review System
  • Array Glass AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Optical Resolution 20 um
    Target Defects Particles, bubbles, water stain
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Review System
  • YMS-2020
    Item Specifications
    MNT Equipment Monitor
    RDV Remote Data Viewer
    SPC Statistical Process Control
    RTT Real-time Trend Tracer
    OVC Offline Video Classification
    DCJA Defect Code Judge Audit
  • Array Tokki Inspection System
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Minimum Real Tokki Height 50 um
    Detected objects Tokkis
    Line scan Output Defect positions, estimated tokkis height
    Optional Functions SPC
  • Array High Speed Twin-heads Defect Review System
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Microscopic lens X2, X5, X10
    Target Defects Particles, line breakages, and other patterned defects
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Simple measurement function
  • Array Multi-heads CDOL System
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Measurement Reproducibility(3σ) X50 magnification : 0.025 um
    Measurement Time 3 secs per point
    Measured Objects Line width, slant pattern, overlay, alignment error, area
    Optional Functions 1.SPC
    2.Feedback result data to process
  • Array Glass AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Optical Resolution 20 um
    Target Defects Particles, bubbles, water stain
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Review System
  • Cell Seal AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Optical Resolution 20~30 um
    Target Defects Particles, seal breakages, seal widths, seal distances
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Review System
    3.Laser Repair System
  • Cell PI AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Optical Resolution 10 um
    Target Defects Particles, PI coating shifts
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Review System
    3.Digital Macro System
  • CF Multi-heads CDOL System
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Measurement Reproducibility(3σ) X50 magnification : 0.1 um
    Measurement Time 3 secs per point
    Measured Objects Line width, BM, overlay, MVA,PS, area
    Optional Functions 1.SPC
    2.Feedback result data to process
  • CF AOI
    Item Specification
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Optical Resolution 8um / 12um
    Target Defects Particles, pin holes, pattern defects, pattern shift
    Line Scan Output Defect positions, defect sizes, defect judgment
    Optional Functions 1. SPC
    2. Review System
  • CF Glass AOI
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Optical Resolution 20~30 um
    Target Defects Particles, bubbles, water stain
    Line scan Output Defect positions, Defect sizes, Defect judgment
    Optional Functions 1.SPC
    2.Remote Image Verification
    3.Real-time Trend Tracer
    4.Review System
  • CF CF Color/Thickness/OD Measurement System
    Item Specifications
    Glass size Up to 1950mm x 2250mm
    Glass thickness 0.5mm~1.1mm
    Color reproducibility x,y<= 0.001 Y<=0.1
    OD reprodicibility OD<=0.05
    Thickness reproducibility <5%
    Thickness measurement range 1um~30um
    Measured Objects CF R,G,B, BM, ITO, OC layers
    Output Data Object film thickness value
    Optional Functions SPC
  • PDP Fluorescence Inspection AOI
    Item Specification
    Optical Resolution 25μm
    Inspection Time 120 secs
    Position Accuracy ±200μm
    Line Scan Output Defect Position, Defect sizes, Mura location.
    Inspection Method Favite Patented Algorithm
    Target Defects Phosphor overflow , Color mixingForeign materials, Pin holes, Color on the rib, Mura.
  • OLED AOI
    Item Specifications
    Glass size 620mm x 375mm
    Glass thickness 0.5mm~1.1mm (Cover and EL glass thickness)
    Optical Resolution 20 um
    Glass type OLED normal glass and soda glass
    Target defects Particles, glue breakages, glue widths, glue bubbes, etc.
    Target measured Defect Position, Defect Size (area),Glue width, etc.
    Optional functions 1. SPC
    2. Review System