PDP Fluorescence Inspection AOI
Item Specification
Optical Resolution 25μm
Inspection Time 120 secs
Position Accuracy ±200μm
Line Scan Output Defect Position, Defect sizes, Mura location.
Inspection Method Favite Patented Algorithm
Target Defects Phosphor overflow , Color mixingForeign materials, Pin holes, Color on the rib, Mura.