It can be used for Array and CF single substrate, plywood, or thinned substrate products, using special optical systems and inspection logic to detect scratches, surface hillocks or pits, cracks, and foreign materials falling out before and after. Inspections such as drops and contaminations are detected and classified, and combined with the human re-judgment function, effective quality control and filter of products are carried out before shipment.

It provides highly accurate defect inspection and classification for ITO conductive films and circuits, which can be applied to various touch display products and fulfills the needs of different customers for product yield improvement and monitoring.