Smart EFEM In-situ SiC Marco Wafer AOI

  • In-situ無縫升級
    可直接整合至現有設備,不增加空間佔用
  • Inline Real-Time 即時監控
    全時監控晶圓Macro外觀瑕疵,精準執行 Chipping 與 Notch 缺口異常偵測
  • 及時防險與 Root-cause 辨識
    即時監控攔檢重大產線異常與連帶破片損失

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