✔ Main Defect Types: Particle, crack, chipping, bubble, stain
✔ Micro OLED Wafer Compatibility: 12-inch Glass wafer
✔ Applicable Process: Cover Glass IQC (Incoming Quality Control)
✔ Glass Defect Types: Foreign material, protrusions/dents, broken pieces, cracks, stains
✔ Simultaneous inspection of the front and back of the glass, with defect location identification (front or back)
✔ AI-powered real-time defect classification
✔ Minimum Detectable Defect Size: 0.3μm